LXRD Residual Stress Analyzer
The LXRD Residual Stress Analyzer is designed for heavy-duty, around-the-clock operation. Extremely fast, accurate, and reliable, the LXRD offers the highest return on investment in the industry. Measurements can be performed in as little as a minute.
The LXRD Residual Stress Analyzer is available with standard or oversized enclosures for large part capacity. Flexible instrument options and available residual stress mapping make the LXRD a proven leader in high-powered residual stress and retained austenite measurement systems.
AVAILABLE MODELS
- STANDARD
- WIDEBODY
- MODULAR
- MAPPING
- GANTRY
- MICROAREA
EASY AND CONVENIENT TO USE
All of PROTO LXRD Residual Stress Analyzer have features that make them easy and convenient to use. The high-performance goniometers maintain ASTM E915 accuracy in low-maintenance designs. The manual focusing pointer enables accurate positioning of the goniometer in complex geometries, while the automated focusing pointer allows convenient focusing of large residual stress maps. A wide variety of x-ray beam apertures are available, including round 0.2, 0.5, 1.0, 2.0, 3.0, and 4.0 mm options and rectangular 0.5×3, 1×3, 0.5×5, 1×5, and 2×5 mm options. High stress standards, zero stress powders, and RA standards ensure accurate results. Integrated cooling makes for self-contained instruments.
ADVANCED FEATURES
Residual stress mapping is available on all LXRD Residual Stress Analyzers, providing a comprehensive picture of the residual stress state of your part. As the originators of residual stress mapping, Proto is a leader in the field. Automated retained austenite (as per ASTM E915) enables characterization of % RA in steels as low as 1%. X-ray elastic constant (XEC) determination ensures automated residual stress measurement material calibration as per ASTM E1426. Pole figures created using the LXRD rotary stages can be used for preferred orientation analysis, single-crystal orientation, and single-crystal stress measurement.