EXPLORER – Theta/Theta High Resolution XRD
Explorer is a multi purpose – Theta/Theta – high resolution diffractometer which, thanks to its direct drive torque motors, offers top performances in many analytical areas, from phase analysis to determination of microstructural properties on bulk or thin film materials.
Thanks to its modularity and the wide range of accessories and attachments available, Explorer allows to perform measurement in different configurations:
X-Ray Powder Diffraction (XPD)
Reflectometry (XRR)
Grazing Incidence X-Ray Diffraction (GIXRD)
High Resolution X-Ray Diffraction (HRXRD)
Total X-Ray Fluorescence (TXRF)
Residual Stress and Texture X-Ray Diffraction.
The modularity and the flexibility of the Explorer equipment allows to start with an entry-level system which can be upgraded to meet new end user requirements. GNR could supply a wide range of X-ray sources, optics, sample holders, detectors and configurations to satisfy several analytical needs.
With no limits to its applications, Explorer modular system offers high performances in all analytical areas, ranging from phase quantification of mixtures, to the determination of microstructural properties as residual stress and preferred orientation of crystallites on bulk materials as well as on thin films.
Product Applications
- Routine Cystalline phase identification and quantification
- Crystallite size – lattice strain and crystallinity calculation
- Polymorph screening and crystal structure analysis
- Residual Stress and Retained Austenite Quantification
- Thin Films, Depth Profiling and non ambient analysis
- Phase Transition monitorin, tecture and preferred orientations
The optics permit switches between Bragg-Brentano, focusing and parallel beam geometry using Johansson or parabolic mirror monochromators.
The high resolution reflectometry studies can be performed with EXPLORER to characterise layer thickness (from 1 to 500 nm with an accuracy better than 1%), density (with an accuracy better than ± 0.03 g/cm3), surface and interface roughness (from 0 to 5 nm with an accuracy better than ± 0.1 nm).
Measurements at low angles and a thin film attachment for parallel beam geometry allow the study of thin films and multilayers.
The coupling between a parabolic mirror monochromator and a channel-cut crystal mounted on the incident beam allows to realise a monochromatic parallel beam with high intensity and low divergence, suitable for high resolution measurements.
Technical Data
| X Ray Generator | Maximum Output Power: 3 kW Max Output voltage: 60 kV Max Output current: 60 mA Voltage Step width: 0.1 kV Current Step width: 0.1 mA |
|---|---|
| X-Ray Tube | Glass (option ceramic), Cu anode (option: Co, Fe, Cr, Mo, W, Ag) 0.4 x 12 mm LFF (Long Fine Focus) (options: 0.4 x 8 mm FF; 1×10 mm NF) |
| Goniometer | Configuration: Vertical Theta/Theta geometry Measuring circle diameters: from 400 to 600 mm Angular Range: – 110° < 2 Theta < + 168° (according to accessories) Angle positioning: Direct drive torque motors with optical encoders Smallest selectable stepsize: 0.0001° Angular accuracy: Better than ± 0.01° over the whole 2-Theta range |
| Detector | 1D/2D detectors Silicon Drift Detectors (SDDs) |
| Case | External Dimensions: width 1427 mm, height 1976 mm, depth 1080 mm Weight: 605 kg |
| Processing Unit | Computer Type: Personal Computer, the latest version Items controlled: X-ray generator, goniometer, sample holder, detector, counting chain |