Residual Stress and Retained Austenite Measurement Systems

LAUE-single

LXRD has been designed for heavy duty around-the-clock operation. Extremely fast, accurate and reliable, the LXRD offers the highest return on investment in the industry. Measurements can be performed in as little as a minute

LXRD is available with standard or oversized enclosures for large part capacity. Flexible instrument options and available residual stress mapping, make the LXRD a proven leader in high-powered residual stress and retained austenite measurement systems.

Software

At the core of every LXRD system is the powerful yet easy to use PROTO XRDWin 2.0 software. A comprehensive Windows®-based data collection and stress analysis package with features such as: linear and elliptical regression, Dolle-Hauk, and triaxial methods. Advanced peak fitting functions: parabolic, gaussian, pearson VII, cauchy, centroid, centered centroid, and mid-chord. Graphical display of peak  intensity, breadth, FWHM, and sin2ψ plots provides informative easy to read results. Software utilities for XEC determination,  principle stress, material removal, depth of penetration, retained austenite, pole figures, and single crystal  stress make a complete package.

Available models

  • Standard
  • Widebody
  • Modular Mapping
  • Gantry
  • Microarea
  • Features
  • Specifications
  • Residual Stress Mapping
  • Automated Retained Austenite
  • X-ray Elastic constant determination (XEC)
  • Pole Figures
  • High performance Goniometer
  • Automated Focus
  • X-ray beam apertures
  • High stress standards , Zero stress powders , % RA standards
  • Integrated Cooling system

laboratory